GE Panametrics UTXDR

Introducing the GE Panametrics UTXDR, the ultrasonic thickness gauge that revolutionizes non-destructive testing. Its advanced features, including: Unmatched accuracy and repeatability Intuitive user interface for seamless operation Rugged design for harsh environments Wireless connectivity for remote data management Set the UTXDR apart from the competition and empower your team with the most reliable and efficient thickness measurement solution.