Keysight U2722A: Versatile Source/Measure Unit for Precision Measurements

Keysight U2722A Source/Measure Unit: Precision Measurement and Control at Your Fingertips Introducing the Keysight U2722A Source/Measure Unit (SMU), an advanced instrument designed to empower engineers and researchers with unparalleled precision and versatility in their measurement and control applications. Product Specifications: 3 independent channels 16-bit resolution In-series or in-parallel operation 4-quadrant operation (source and sink) Voltage range: ±20 V Current range: ±1 A Measurement accuracy: 0.02% Features and Benefits: Multi-channel capability: Measure and control multiple devices simultaneously, saving time and increasing efficiency. High resolution and accuracy: Capture precise measurements with 16-bit resolution and 0.02% accuracy, ensuring reliable and repeatable results. Versatile operation modes: Choose between in-series or in-parallel operation to adapt to different measurement scenarios. 4-quadrant operation: Source or sink voltage and current, enabling comprehensive characterization of devices. Intuitive software interface: Control the SMU effortlessly through the user-friendly Keysight BenchVue software, simplifying setup and data analysis. Value to the Customer: The Keysight U2722A SMU offers exceptional value to customers by: Accelerating research and development: Enable faster and more accurate device characterization, reducing time-to-market. Improving product quality: Ensure the reliability and performance of electronic devices through precise measurements and control. Optimizing manufacturing processes: Monitor and control production lines with high precision, reducing defects and increasing yield. Simplifying test setups: Combine multiple measurement functions into a single instrument, reducing complexity and saving space. With its advanced capabilities and user-centric design, the Keysight U2722A Source/Measure Unit is the ideal choice for engineers and researchers seeking precision, versatility, and efficiency in their measurement and control applications.