RIGOL RP7150S: The Ultimate Active Probe for Precision Measurements

Features and Specifications: RIGOL RP7150S Active Probe Active Single-Ended Product Overview: The RIGOL RP7150S Active Probe is a high-performance active single-ended probe designed to provide accurate and reliable measurements in a wide range of applications. With its exceptional bandwidth, low input capacitance, and high input impedance, the RP7150S is ideal for testing high-speed signals and sensitive circuits. Features: Bandwidth: 1.5 GHz Input Capacitance: 1.5 pF Input Impedance: 1 MΩ // 15 pF Attenuation: 10:1 Rise Time: 233 ps Maximum Input Voltage: ±15 V Offset Range: ±10 V Power Supply: USB or Probe Power Supply Specifications: DC Accuracy: ±0.5% Gain Accuracy: ±0.5% Phase Accuracy: ±1° Common Mode Rejection Ratio (CMRR): >80 dB Differential Mode Rejection Ratio (DMRR): >80 dB Operating Temperature: 0°C to 50°C Storage Temperature: -20°C to 70°C What’s in the Box: RP7150S Active Probe Ground Lead Probe Tip Calibration Certificate Benefits: High Bandwidth: Accurately measure high-speed signals up to 1.5 GHz. Low Input Capacitance: Minimize circuit loading and preserve signal integrity. High Input Impedance: Avoid signal distortion and ensure accurate measurements. Wide Attenuation Range: Adjust the probe’s attenuation to match the signal amplitude. Fast Rise Time: Capture fast-rising signals with minimal distortion. High Input Voltage: Measure signals up to ±15 V without damage. Offset Range: Adjust the probe’s offset to compensate for DC offsets. USB or Probe Power Supply: Power the probe conveniently from a USB port or a dedicated probe power supply. Value to the Customer: The RIGOL RP7150S Active Probe is an essential tool for engineers and technicians who need to perform precise measurements on high-speed signals and sensitive circuits. Its exceptional performance and versatility make it an invaluable asset for a wide range of applications, including: Digital circuit debugging High-speed signal analysis Power supply testing Sensor characterization Automotive electronics testing