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SPM Instrument MG4-2
Introducing the SPM Instrument MG4-2, the ultimate solution for precise and reliable surface characterization. With its advanced scanning probe microscopy (SPM) technology, the MG4-2 offers unparalleled resolution and versatility, enabling you to explore the nanoscale world with unprecedented clarity. Its unique combination of high-speed imaging, atomic force microscopy (AFM), and scanning tunneling microscopy (STM) capabilities sets it apart from the competition, providing a comprehensive analysis platform for materials science, nanotechnology, and life sciences research.
$1,131.00 -
Unveiling Precision: Keithley 6430 Sub-femtoamp Remote SourceMeter for Ultra-Sensitive Measurements
Keithley 6430 Sub-femtoamp Remote SourceMeter: Ultra-low current sourcing and measurement down to 1 fA, 100 V compliance, 100 pA resolution, and remote operation for automated testing.
$15,085.00 -
Crystal Engineering ATMI-T-3M
Crystal Engineering ATMI-T-3M: The industry’s only 3-meter, high-precision, non-contact laser tracker with a 100-meter range, delivering exceptional accuracy and extended measurement volume for large-scale metrology applications.
$557.00 -
SPM Instrument ELS14KIT
The SPM Instrument ELS14KIT is the most advanced and user-friendly electroluminescence system on the market. With its patented technology, the ELS14KIT provides superior image quality and sensitivity, making it the ideal choice for researchers and engineers in the fields of materials science, semiconductor physics, and optoelectronics.
$809.00 -
Ralston Instruments QTAP0200+QTFIT
Introducing the Ralston Instruments QTAP0200 QTFIT, the ultimate solution for precise and efficient torque measurement. Unlike competitors, our QTFIT features: Patented strain gauge technology for unmatched accuracy and repeatability Compact and lightweight design for easy handling and portability Intuitive software interface for seamless data acquisition and analysis Advanced calibration capabilities for exceptional reliability and traceability
$421.00